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  • Industrial Leather Products, USA, AGS-TECH Inc.

    Industrial leather products including honing and sharpening belts, leather transmission belts, sewing machine leather treadle belt, leather tool organizers and holders, leather gun holsters, leather steering wheel covers and more. Индустриски кожни производи Industrial leather products manufactured include: - Leather Honing and Sharpening Belts - Leather Transmission Belts - Sewing Machine Leather Treadle Belt - Leather Tool Organizers & Holders - Leather Gun Holsters Leather is a natural product with outstanding properties that make it a good fit for many applications. Industrial leather belts are used in power transmissions, as sewing machine leather treadle belts as well as fastening, securing, honing and sharpening of metal blades among many others. Besides our off-shelf industrial leather belts listed in our brochures, endless belts and special lengths / widths can also be produced for you. Applications of industrial leather includes Flat Leather Belting for power transmission and Round Leather Belting for Industrial Sewing Machines. Industrial leather is one of the oldest types of manufactured products. Our Vegetable Tanned Industrial leathers are pit tanned for many months and heavily dressed with a mixture of oils and greased to give its ultimate strength. Our Chrome Industrial Leathers can be manufactured in various ways, waxed, oiled or dry for moulding. We offer a chrome-retanned leather manufactured to withstand very high temperatures and they can be used for hydraulic applications and packings. Our Chrome Friction leathers are designed to have extraordinary abrasion properties. Various Shore Hardnesses are available. Many other applications of industrial leather products exist, including wearable tool organizers, tool holders, leather threads, steering wheel covers...etc. We are here to help you in your projects. A blueprint, a sketch, a photo or sample can serve to make us understand your product needs. We can either manufacture the industrial leather product according to your design, or we can help you in your design work and once you approve the final design, we can manufacture the product for you. Since we supply a wide variety of industrial leather products with different dimensions, applications and material grade; it is impossible to list them all here. We encourage you to email or call us so we can determine which product is the best fit for you. When contacting us, please make sure to inform us about: - Your application for the industrial leather products - Material grade desired & needed - Dimensions - Finish - Packaging requirements - Labeling requirements - Quantity ПРЕТХОДНА СТРАНИЦА

  • Nanomanufacturing, Nanoparticles, Nanotubes, Nanocomposites, CNT

    Nanomanufacturing - Nanoparticles - Nanotubes - Nanocomposites - Nanophase Ceramics - CNT - AGS-TECH Inc. - New Mexico Производство на нано / Nanomanufacturing Our nanometer length scale parts and products are produced using NANOSCALE MANUFACTURING / NANOMANUFACTURING. This area is still in its infancy, but holds great promises for the future. Molecularly engineered devices, medicines, pigments…etc. are being developed and we are working with our partners to stay ahead of the competition. The following are some of the commercially available products we currently offer: CARBON NANOTUBES NANOPARTICLES NANOPHASE CERAMICS CARBON BLACK REINFORCEMENT for rubber and polymers NANOCOMPOSITES in tennis balls, baseball bats, motorcycles and bikes MAGNETIC NANOPARTICLES for data storage NANOPARTICLE catalytic converters Nanomaterials may be any one of the four types, namely metals, ceramics, polymers or composites. Generally, NANOSTRUCTURES are less than 100 nanometers. In nanomanufacturing we take one of two approaches. As an example, in our top-down approach we take a silicon wafer, use lithography, wet and dry etching methods to construct tiny microprocessors, sensors, probes. On the other hand, in our bottom-up nanomanufacturing approach we use atoms and molecules to build tiny devices. Some of the physical and chemical characteristics exhibited by matter may experience extreme changes as particle size approaches atomic dimensions. Opaque materials in their macroscopic state may become transparent in their nanoscale. Materials that are chemically stable in macrostate may become combustible in their nanoscale and electrically insulating materials may become conductors. Currently the following are among the commercial products we are able to offer: CARBON NANOTUBE (CNT) DEVICES / NANOTUBES: We can visualize carbon nanotubes as tubular forms of graphite from which nanoscale devices can be constructed. CVD, laser ablation of graphite, carbon-arc discharge can be used to produce carbon nanotube devices. Nanotubes are categorized as single-walled nanotubes (SWNTs) and multi-walled nanotubes (MWNTs) and can be doped with other elements. Carbon nanotubes (CNTs) are allotropes of carbon with a nanostructure that can have a length-to-diameter ratio greater than 10,000,000 and as high as 40,000,000 and even higher. These cylindrical carbon molecules have properties that make them potentially useful in applications in nanotechnology, electronics, optics, architecture and other fields of materials science. They exhibit extraordinary strength and unique electrical properties, and are efficient conductors of heat. Nanotubes and spherical buckyballs are members of the fullerene structural family. The cylindrical nanotube usually has at least one end capped with a hemisphere of the buckyball structure. The name nanotube is derived from its size, since the diameter of a nanotube is in the order of a few nanometers, with lengths of at least several millimeters. The nature of the bonding of a nanotube is described by orbital hybridization. The chemical bonding of nanotubes is composed entirely of sp2 bonds, similar to those of graphite. This bonding structure, is stronger than the sp3 bonds found in diamonds, and provides the molecules with their unique strength. Nanotubes naturally align themselves into ropes held together by Van der Waals forces. Under high pressure, nanotubes can merge together, trading some sp2 bonds for sp3 bonds, giving the possibility of producing strong, unlimited-length wires through high-pressure nanotube linking. The strength and flexibility of carbon nanotubes makes them of potential use in controlling other nanoscale structures. Single-walled nanotubes with tensile strengths between 50 and 200 GPa have been produced, and these values are approximately an order of magnitude greater than for carbon fibers. Elastic modulus values are on the order of 1 Tetrapascal (1000 GPa) with fracture strains between about 5% to 20%. The outstanding mechanical properties of the carbon nanotubes makes us use them in tough clothes and sports gear, combat jackets. Carbon nanotubes have strength comparable to diamond, and they are weaved into clothes to create stab-proof and bulletproof clothing. By cross-linking CNT molecules prior to incorporation in a polymer matrix we can form a super high strength composite material. This CNT composite could have a tensile strength on the order of 20 million psi (138 GPa), revolutionizing engineering design where low weight and high strength is required. Carbon nanotubes reveal also unusual current conduction mechanisms. Depending on the orientation of the hexagonal units in the graphene plane (i.e. tube walls) with the tube axis, the carbon nanotubes may behave either as metals or semiconductors. As conductors, carbon nanotubes have very high electrical current-carrying capability. Some nanotubes may be able to carry current densities over 1000 times that of silver or copper. Carbon nanotubes incorporated into polymers improve their static electricity discharge capability. This has applications in automobile and airplane fuel lines and production of hydrogen storage tanks for hydrogen-powered vehicles. Carbon nanotubes have shown to exhibit strong electron-phonon resonances, which indicate that under certain direct current (DC) bias and doping conditions their current and the average electron velocity, as well as the electron concentration on the tube oscillate at terahertz frequencies. These resonances can be used to make terahertz sources or sensors. Transistors and nanotube integrated memory circuits have been demonstrated. The carbon nanotubes are used as a vessel for transporting drugs into the body. The nanotube allows for the drug dosage to be lowered by localizing its distribution. This is also economically viable due to lower amounts of drugs being used.. The drug can be either attached to the side of the nanotube or trailed behind, or the drug can actually be placed inside the nanotube. Bulk nanotubes are a mass of rather unorganized fragments of nanotubes. Bulk nanotube materials may not reach tensile strengths similar to that of individual tubes, but such composites may nevertheless yield strengths sufficient for many applications. Bulk carbon nanotubes are being used as composite fibers in polymers to improve the mechanical, thermal and electrical properties of the bulk product. Transparent, conductive films of carbon nanotubes are being considered to replace indium tin oxide (ITO). Carbon nanotube films are mechanically more robust than ITO films, making them ideal for high reliability touch screens and flexible displays. Printable water-based inks of carbon nanotube films are desired to replace ITO. Nanotube films show promise for use in displays for computers, cell phones, ATMs….etc. Nanotubes have been used to improve ultracapacitors. The activated charcoal used in conventional ultracapacitors has many small hollow spaces with a distribution of sizes, which create together a large surface to store electric charges. However as charge is quantized into elementary charges, i.e. electrons, and each of these needs a minimum space, a large fraction of the electrode surface is not available for storage because the hollow spaces are too small. With electrodes made of nanotubes, the spaces are planned to be tailored to size, with only a few being too large or too small and consequently the capacity to be increased. A solar cell developed uses a carbon nanotube complex, made of carbon nanotubes combined with tiny carbon buckyballs (also called Fullerenes) to form snake-like structures. Buckyballs trap electrons, but they can't make electrons flow. When sunlight excites the polymers, the buckyballs grab the electrons. Nanotubes, behaving like copper wires, will then be able to make the electrons or current flow. NANOPARTICLES: Nanoparticles can be considered a bridge between bulk materials and atomic or molecular structures. A bulk material generally has constant physical properties throughout regardless of its size, but at the nanoscale this is often not the case. Size-dependent properties are observed such as quantum confinement in semiconductor particles, surface plasmon resonance in some metal particles and superparamagnetism in magnetic materials. Properties of materials change as their size is reduced to nanoscale and as the percentage of atoms at the surface becomes significant. For bulk materials larger than a micrometer the percentage of atoms at the surface is very small compared to the total number of atoms in the material. The different and outstanding properties of nanoparticles are partly due to the aspects of the surface of the material dominating the properties in lieu of the bulk properties. For example, the bending of bulk copper occurs with movement of copper atoms/clusters at about the 50 nm scale. Copper nanoparticles smaller than 50 nm are considered super hard materials that do not exhibit the same malleability and ductility as bulk copper. The change in properties is not always desirable. Ferroelectric materials smaller than 10 nm can switch their magnetization direction using room temperature thermal energy, making them useless for memory storage. Suspensions of nanoparticles are possible because the interaction of the particle surface with the solvent is strong enough to overcome differences in density, which for larger particles usually results in a material either sinking or floating in a liquid. Nanoparticles have unexpected visible properties because they are small enough to confine their electrons and produce quantum effects. For example gold nanoparticles appear deep red to black in solution. The large surface area to volume ratio reduces the melting temperatures of nanoparticles. The very high surface area to volume ratio of nanoparticles is a driving force for diffusion. Sintering can take place at lower temperatures, in less time than for larger particles. This should not affect the density of the final product, however flow difficulties and the tendency of nanoparticles to agglomerate can cause issues. The presence of Titanium Dioxide nanoparticles impart a self-cleaning effect, and the size being nanorange, the particles can't be seen. Zinc Oxide nanoparticles have UV blocking properties and are added to sunscreen lotions. Clay nanoparticles or carbon black when incorporated into polymer matrices increase reinforcement, offering us stronger plastics, with higher glass transition temperatures. These nanoparticles are hard, and impart their properties to the polymer. Nanoparticles attached to textile fibers can create smart and functional clothing. NANOPHASE CERAMICS: Using nanoscale particles in the production of ceramic materials we can have simultaneous and major increase in both strength and ductility. Nanophase ceramics are also utilized for catalysis because of their high surface-to-area ratios. Nanophase ceramic particles such as SiC are also used as reinforcement in metals such as aluminum matrix. If you can think of an application for nanomanufacturing useful for your business, let us know and receive our input. We can design, prototype, manufacture, test and deliver these to you. We put great value in intellectual property protection and can make special arrangements for you to ensure your designs and products are not copied. Our nanotechnology designers and nanomanufacturing engineers are some of the best in the World and they are the same people who developed some of the World's most advanced and smallest devices. Click on blue colored text below to download product catalogs and brochures: - Private Label Nano Surface Protection Car Care Products We can label these products with your name and logo if you wish - Private Label Nano Surface Industrial Products We can label these products with your name and logo if you wish - Private Label Nano Surface Protection Marine Products We can label these products with your name and logo if you wish - Private Label Nano Surface Protection Products We can label these products with your name and logo if you wish КЛИКНЕТЕ Услуга за пронаоѓање на производи-локатор ПРЕТХОДНА СТРАНИЦА

  • Electronic Testers, Electrical Properties Testing, Oscilloscope, Pulse

    Electronic Testers - Electrical Test Equipment - Electrical Properties Testing - Oscilloscope - Signal Generator - Function Generator - Pulse Generator - Frequency Synthesizer - Multimeter Електрична и електронска опрема за тестирање With the term ELECTRONIC TESTER we refer to test equipment that is used primarily for testing, inspection and analysis of electrical and electronic components and systems. We offer the most popular ones in the industry: POWER SUPPLIES & SIGNAL GENERATING DEVICES: POWER SUPPLY, SIGNAL GENERATOR, FREQUENCY SYNTHESIZER, FUNCTION GENERATOR, DIGITAL PATTERN GENERATOR, PULSE GENERATOR, SIGNAL INJECTOR METERS: DIGITAL MULTIMETERS, LCR METER, EMF METER, CAPACITANCE METER, BRIDGE INSTRUMENT, CLAMP METER, GAUSSMETER / TESLAMETER/ MAGNETOMETER, GROUND RESISTANCE METER ANALYZERS: OSCILLOSCOPES, LOGIC ANALYZER, SPECTRUM ANALYZER, PROTOCOL ANALYZER, VECTOR SIGNAL ANALYZER, TIME-DOMAIN REFLECTOMETER, SEMICONDUCTOR CURVE TRACER, NETWORK ANALYZER, PHASE ROTATION TESTER, FREQUENCY COUNTER You can purchase brand new, refurbished or used test equipment from us at the most competitive discounted prices. Simply choose the product from the downloadable catalogs and let us know the product name, product code and relevant information and we will send you our quote. Download by clicking on highlighted text: ANRITSU Electronic Measuring Instruments FLUKE Test Tools Catalog KEYSIGHT Basic Automotive Test Products KEYSIGHT Basic Instruments KEYSIGHT Bench and Power Products KEYSIGHT Network Analyzer Products KEYSIGHT Signal Generation Solutions KEYSIGHT Smart Bench Essentials Series Products KEYSIGHT High-Volume Traffic Generator Products KEYSIGHT Layer 4-7 Network Test Products KEYSIGHT Layer 2-3 Network Test Products KEYSIGHT Distribution Products Catalog MEGGER Low Voltage Test Tools Catalog MICROWAVE Flexible Cable Assembly MICROWAVE and MILIMETER WAVE Test Accessories Brochure (Cable assemblies, VNA Test Assemblies, Mechanical Calibration Kits, RF Coaxial Adapters, Test Port Adapters, DC Blocks, NMD Connectors....etc.) Private Label Hand Tools for Every Industry (This catalog contains a few electrical & electronic test instruments. We can private label these hand tools if you wish. In other words, we can put your company name, brand and label on them. This way you can promote your brand by reselling these to your customers.) ROHDE SCHWARZ Benchtop Power Supplies Ideal for labs and system racks, galvanic isolation, floating channels, constant voltage or current modes, protection functions, parallel and serial operation, low ripple/noise, remote sensing option ROHDE SCHWARZ Test Equipment Catalog (Oscilloscopes, Power Supplies, Signal Generators, Handheld Analyzers, Spectrum Analyzers, Vector Network Analyzers, Meters & Counters) TEKTRONIX Product Catalog for Test and Measurement Solutions VANDAL-PROOF IP65/IP67/IP68 Keyboards, Keypads, Pointing Devices, ATM Pinpads, Medical & Military Keyboards and other similar Rugged Computer Peripherals For details and other similar equipment, please visit our equipment website: http://www.sourceindustrialsupply.com Let us briefly go over some of these equipment in everyday use throughout the industry: The electrical power supplies we supply for metrology purposes are discrete, benchtop and stand-alone devices. The ADJUSTABLE REGULATED ELECTRICAL POWER SUPPLIES are some of the most popular ones, because their output values can be adjusted and their output voltage or current is maintained constant even if there are variations in input voltage or load current. ISOLATED POWER SUPPLIES have power outputs that are electrically independent of their power inputs. Depending on their power conversion method, there are LINEAR and SWITCHING POWER SUPPLIES. The linear power supplies process the input power directly with all their active power conversion components working in the linear regions, whereas the switching power supplies have components working predominantly in non-linear modes (such as transistors) and convert power to AC or DC pulses before processing. Switching power supplies are generally more efficient than linear supplies because they lose less power due to shorter times their components spend in the linear operating regions. Depending on application, a DC or AC power is used. Other popular devices are PROGRAMMABLE POWER SUPPLIES, where voltage, current or frequency can be remotely controlled through an analog input or digital interface such as an RS232 or GPIB. Many of them have an integral microcomputer to monitor and control the operations. Such instruments are essential for automated testing purposes. Some electronic power supplies use current limiting instead of cutting off power when overloaded. Electronic limiting is commonly used on lab bench type instruments. SIGNAL GENERATORS are another widely used instruments in lab and industry, generating repeating or non-repeating analog or digital signals. Alternatively they are also called FUNCTION GENERATORS, DIGITAL PATTERN GENERATORS or FREQUENCY GENERATORS. Function generators generate simple repetitive waveforms such as sine waves, step pulses, square & triangular and arbitrary waveforms. With Arbitrary waveform generators the user can generate arbitrary waveforms, within published limits of frequency range, accuracy, and output level. Unlike function generators, which are limited to a simple set of waveforms, an arbitrary waveform generator allows the user to specify a source waveform in a variety of different ways. RF and MICROWAVE SIGNAL GENERATORS are used for testing components, receivers and systems in applications such as cellular communications, WiFi, GPS, broadcasting, satellite communications and radars. RF signal generators generally work between a few kHz to 6 GHz, while microwave signal generators operate within a much wider frequency range, from less than 1 MHz to at least 20 GHz and even up to hundreds of GHz ranges using special hardware. RF and microwave signal generators can be classified further as analog or vector signal generators. AUDIO-FREQUENCY SIGNAL GENERATORS generate signals in the audio-frequency range and above. They have electronic lab applications checking of the frequency response of audio equipment. VECTOR SIGNAL GENERATORS, sometimes also referred to as DIGITAL SIGNAL GENERATORS are capable of generating digitally-modulated radio signals. Vector signal generators can generate signals based on industry standards such as GSM, W-CDMA (UMTS) and Wi-Fi (IEEE 802.11). LOGIC SIGNAL GENERATORS are also called DIGITAL PATTERN GENERATOR. These generators produce logic types of signals, that is logic 1s and 0s in the form of conventional voltage levels. Logic signal generators are used as stimulus sources for functional validation & testing of digital integrated circuits and embedded systems. The devices mentioned above are for general-purpose use. There are however many other signal generators designed for custom specific applications. A SIGNAL INJECTOR is a very useful and quick troubleshooting tool for signal tracing in a circuit. Technicians can determine the faulty stage of a device such as a radio receiver very quickly. The signal injector can be applied to the speaker output, and if the signal is audible one can move to the preceding stage of the circuit. In this case an audio amplifier, and if the injected signal is heard again one can move the signal injection up the stages of the circuit until the signal is no longer audible. This will serve the purpose of locating the location of the problem. A MULTIMETER is an electronic measuring instrument combining several measurement functions in one unit. Generally, multimeters measure voltage, current, and resistance. Both digital and analog version are available. We offer portable hand-held multimeter units as well as laboratory-grade models with certified calibration. Modern multimeters can measure many parameters such as: Voltage (both AC / DC), in volts, Current (both AC / DC), in amperes, Resistance in ohms. Additionally, some multimeters measure: Capacitance in farads, Conductance in siemens, Decibels, Duty cycle as a percentage, Frequency in hertz, Inductance in henries, Temperature in degrees Celsius or Fahrenheit, using a temperature test probe. Some multimeters also include: Continuity tester; sounds when a circuit conducts, Diodes (measuring forward drop of diode junctions), Transistors (measuring current gain and other parameters), battery checking function, light level measuring function, acidity & Alkalinity (pH) measuring function and relative humidity measuring function. Modern multimeters are often digital. Modern digital multimeters often have an embedded computer to make them very powerful tools in metrology and testing. They include features such as:: •Auto-ranging, which selects the correct range for the quantity under test so that the most significant digits are shown. •Auto-polarity for direct-current readings, shows if the applied voltage is positive or negative. •Sample and hold, which will latch the most recent reading for examination after the instrument is removed from the circuit under test. •Current-limited tests for voltage drop across semiconductor junctions. Even though not a replacement for a transistor tester, this feature of digital multimeters facilitates testing diodes and transistors. •A bar graph representation of the quantity under test for better visualization of fast changes in measured values. •A low-bandwidth oscilloscope. •Automotive circuit testers with tests for automotive timing and dwell signals. •Data acquisition feature to record maximum and minimum readings over a given period, and to take a number of samples at fixed intervals. •A combined LCR meter. Some multimeters can be interfaced with computers, while some can store measurements and upload them to a computer. Yet another very useful tool, an LCR METER is a metrology instrument for measuring the inductance (L), capacitance (C), and resistance (R) of a component. The impedance is measured internally and converted for display to the corresponding capacitance or inductance value. Readings will be reasonably accurate if the capacitor or inductor under test does not have a significant resistive component of impedance. Advanced LCR meters measure true inductance and capacitance, and also the equivalent series resistance of capacitors and the Q factor of inductive components. The device under test is subjected to an AC voltage source and the meter measures the voltage across and the current through the tested device. From the ratio of voltage to current the meter can determine the impedance. The phase angle between the voltage and current is also measured in some instruments. In combination with the impedance, the equivalent capacitance or inductance, and resistance, of the device tested can be calculated and displayed. LCR meters have selectable test frequencies of 100 Hz, 120 Hz, 1 kHz, 10 kHz, and 100 kHz. Benchtop LCR meters typically have selectable test frequencies of more than 100 kHz. They often include possibilities to superimpose a DC voltage or current on the AC measuring signal. While some meters offer the possibility to externally supply these DC voltages or currents other devices supply them internally. An EMF METER is a test & metrology instrument for measuring electromagnetic fields (EMF). Majority of them measure the electromagnetic radiation flux density (DC fields) or the change in an electromagnetic field over time (AC fields). There are single axis and tri-axis instrument versions. Single axis meters cost less than tri-axis meters, but take longer to complete a test because the meter only measures one dimension of the field. Single axis EMF meters have to be tilted and turned on all three axes to complete a measurement. On the other hand, tri-axis meters measure all three axes simultaneously, but are more expensive. An EMF meter can measure AC electromagnetic fields, which emanate from sources such as electrical wiring, while GAUSSMETERS / TESLAMETERS or MAGNETOMETERS measure DC fields emitted from sources where direct current is present. The majority of EMF meters are calibrated to measure 50 and 60 Hz alternating fields corresponding to the frequency of US and European mains electricity. There are other meters which can measure fields alternating at as low as 20 Hz. EMF measurements can be broadband across a wide range of frequencies or frequency selective monitoring only the frequency range of interest. A CAPACITANCE METER is a test equipment used to measure capacitance of mostly discrete capacitors. Some meters display the capacitance only, whereas others also display leakage, equivalent series resistance, and inductance. Higher end test instruments use techniques such as inserting the capacitor-under-test into a bridge circuit. By varying the values of the other legs in the bridge so as to bring the bridge into balance, the value of the unknown capacitor is determined. This method ensures greater precision. The bridge may also be capable to measure series resistance and inductance. Capacitors over a range from picofarads to farads may be measured. Bridge circuits do not measure leakage current, but a DC bias voltage can be applied and the leakage measured directly. Many BRIDGE INSTRUMENTS can be connected to computers and data exchange be made to download readings or to control the bridge externally. Such bridge instruments aso offer go / no go testing for automation of tests in a fast paced production & quality control environment. Yet, another test instrument, a CLAMP METER is an electrical tester combining a voltmeter with a clamp type current meter. Most modern versions of clamp meters are digital. Modern clamp meters have most of the basic functions of a Digital Multimeter, but with the added feature of a current transformer built into the product. When you clamp the instrument’s “jaws” around a conductor carrying a large ac current, that current is coupled through the jaws, similar to the iron core of a power transformer, and into a secondary winding which is connected across the shunt of the meter’s input, the principle of operation resembling much that of a transformer. A much smaller current is delivered to the meter’s input due to the ratio of the number of secondary windings to the number of primary windings wrapped around the core. The primary is represented by the one conductor around which the jaws are clamped. If the secondary has 1000 windings, then the secondary current is 1/1000 the current flowing in the primary, or in this case the conductor being measured. Thus, 1 amp of current in the conductor being measured would produce 0.001 amps of current at the input of the meter. With clamp meters much larger currents can be easily measured by increasing the number of turns in the secondary winding. As with most of our test equipment, advanced clamp meters offer logging capability. GROUND RESISTANCE TESTERS are used for testing the earth electrodes and the soil resistivity. The instrument requirements depend on the range of applications. Modern clamp-on ground testing instruments simplify ground loop testing and enable non-intrusive leakage current measurements. Among the ANALYZERS we sell are OSCILLOSCOPES without doubt one of the most widely used equipment. An oscilloscope, also called an OSCILLOGRAPH, is a type of electronic test instrument that allows observation of constantly varying signal voltages as a two-dimensional plot of one or more signals as a function of time. Non-electrical signals like sound and vibration can also be converted to voltages and displayed on oscilloscopes. Oscilloscopes are used to observe the change of an electrical signal over time, the voltage and time describe a shape which is continuously graphed against a calibrated scale. Observation and analysis of the waveform reveals us properties such as amplitude, frequency, time interval, rise time, and distortion. Oscilloscopes can be adjusted so that repetitive signals can be observed as a continuous shape on the screen. Many oscilloscopes have storage function that allows single events to be captured by the instrument and displayed for a relatively long time. This allows us to observe events too fast to be directly perceptible. Modern oscilloscopes are lightweight, compact and portable instruments. There are also miniature battery-powered instruments for field service applications. Laboratory grade oscilloscopes are generally bench-top devices. There is a vast variety of probes and input cables for use with oscilloscopes. Please contact us in case you need advice about which one to use in your application. Oscilloscopes with two vertical inputs are called dual-trace oscilloscopes. Using a single-beam CRT, they multiplex the inputs, usually switching between them fast enough to display two traces apparently at once. There are also oscilloscopes with more traces; four inputs are common among these. Some multi-trace oscilloscopes use the external trigger input as an optional vertical input, and some have third and fourth channels with only minimal controls. Modern oscilloscopes have several inputs for voltages, and thus can be used to plot one varying voltage versus another. This is used for example for graphing I-V curves (current versus voltage characteristics) for components such as diodes. For high frequencies and with fast digital signals the bandwidth of the vertical amplifiers and sampling rate must be high enough. For-general purpose use a bandwidth of at least 100 MHz is usually sufficient. A much lower bandwidth is sufficient for audio-frequency applications only. Useful range of sweeping is from one second to 100 nanoseconds, with appropriate triggering and sweep delay. A well-designed, stable, trigger circuit is required for a steady display. The quality of the trigger circuit is key for good oscilloscopes. Another key selection criteria is the sample memory depth and sample rate. Basic level modern DSOs now have 1MB or more of sample memory per channel. Often this sample memory is shared between channels, and can sometimes only be fully available at lower sample rates. At the highest sample rates the memory may be limited to a few 10's of KB. Any modern ''real-time'' sample rate DSO will have typically 5-10 times the input bandwidth in sample rate. So a 100 MHz bandwidth DSO would have 500 Ms/s - 1 Gs/s sample rate. Greatly increased sample rates have largely eliminated the display of incorrect signals that was sometimes present in the first generation of digital scopes. Most modern oscilloscopes provide one or more external interfaces or buses such as GPIB, Ethernet, serial port, and USB to allow remote instrument control by external software. Here is a list of different oscilloscope types: CATHODE RAY OSCILLOSCOPE DUAL-BEAM OSCILLOSCOPE ANALOG STORAGE OSCILLOSCOPE DIGITAL OSCILLOSCOPES MIXED-SIGNAL OSCILLOSCOPES HANDHELD OSCILLOSCOPES PC-BASED OSCILLOSCOPES A LOGIC ANALYZER is an instrument that captures and displays multiple signals from a digital system or digital circuit. A logic analyzer may convert the captured data into timing diagrams, protocol decodes, state machine traces, assembly language. Logic Analyzers have advanced triggering capabilities, and are useful when the user needs to see the timing relationships between many signals in a digital system. MODULAR LOGIC ANALYZERS consist of both a chassis or mainframe and logic analyzer modules. The chassis or mainframe contains the display, controls, control computer, and multiple slots into which the data-capturing hardware is installed. Each module has a specific number of channels, and multiple modules can be combined to obtain a very high channel count. The ability to combine multiple modules to obtain a high channel count and the generally higher performance of modular logic analyzers makes them more expensive. For the very high end modular logic analyzers, the users may need to provide their own host PC or purchase an embedded controller compatible with the system. PORTABLE LOGIC ANALYZERS integrate everything into a single package, with options installed at the factory. They generally have lower performance than modular ones, but are economical metrology tools for general purpose debugging. In PC-BASED LOGIC ANALYZERS, the hardware connects to a computer through a USB or Ethernet connection and relays the captured signals to the software on the computer. These devices are generally much smaller and less expensive because they make use of a personal computer’s existing keyboard, display and CPU. Logic analyzers can be triggered on a complicated sequence of digital events, then capture large amounts of digital data from the systems under test. Today specialized connectors are in use. The evolution of logic analyzer probes has led to a common footprint that multiple vendors support, which provides added freedom to end users: Connectorless technology offered as several vendor-specific trade names such as Compression Probing; Soft Touch; D-Max is being used. These probes provide a durable, reliable mechanical and electrical connection between the probe and the circuit board. A SPECTRUM ANALYZER measures the magnitude of an input signal versus frequency within the full frequency range of the instrument. The primary use is to measure the power of the spectrum of signals. There are optical and acoustical spectrum analyzers as well, but here we will discuss only electronic analyzers that measure and analyze electrical input signals. The spectra obtained from electrical signals provides us information about frequency, power, harmonics, bandwidth…etc. The frequency is displayed on the horizonal axis and the signal amplitude on the vertical. Spectrum analyzers are widely used in the electronics industry for the analyses of the frequency spectrum of radio frequency, RF and audio signals. Looking at the spectrum of a signal we are able to reveal elements of the signal, and the performance of the circuit producing them. Spectrum analyzers are able to make a large variety of measurements. Looking at the methods used to obtain the spectrum of a signal we can categorize the spectrum analyzer types. - A SWEPT-TUNED SPECTRUM ANALYZER uses a superheterodyne receiver to down-convert a portion of the input signal spectrum (using a voltage-controlled oscillator and a mixer) to the center frequency of a band-pass filter. With a superheterodyne architecture, the voltage-controlled oscillator is swept through a range of frequencies, taking advantage of the full frequency range of the instrument. Swept-tuned spectrum analyzers are descended from radio receivers. Therefore swept-tuned analyzers are either tuned-filter analyzers (analogous to a TRF radio) or superheterodyne analyzers. In fact, in their simplest form, you could think of a swept-tuned spectrum analyzer as a frequency-selective voltmeter with a frequency range that is tuned (swept) automatically. It is essentially a frequency-selective, peak-responding voltmeter calibrated to display the rms value of a sine wave. The spectrum analyzer can show the individual frequency components that make up a complex signal. However it does not provide phase information, only magnitude information. Modern swept-tuned analyzers (superheterodyne analyzers, in particular) are precision devices that can make a wide variety of measurements. However, they are primarily used to measure steady-state, or repetitive, signals because they can't evaluate all frequencies in a given span simultaneously. The ability to evaluate all frequencies simultaneously is possible with only the real-time analyzers. - REAL-TIME SPECTRUM ANALYZERS: A FFT SPECTRUM ANALYZER computes the discrete Fourier transform (DFT), a mathematical process that transforms a waveform into the components of its frequency spectrum, of the input signal. The Fourier or FFT spectrum analyzer is another real-time spectrum analyzer implementation. The Fourier analyzer uses digital signal processing to sample the input signal and convert it to the frequency domain. This conversion is done using the Fast Fourier Transform (FFT). The FFT is an implementation of the Discrete Fourier Transform, the math algorithm used for transforming data from the time domain to the frequency domain. Another type of real-time spectrum analyzers, namely the PARALLEL FILTER ANALYZERS combine several bandpass filters, each with a different bandpass frequency. Each filter remains connected to the input at all times. After an initial settling time, the parallel-filter analyzer can instantaneously detect and display all signals within the analyzer's measurement range. Therefore, the parallel-filter analyzer provides real-time signal analysis. Parallel-filter analyzer is fast, it measures transient and time-variant signals. However, the frequency resolution of a parallel-filter analyzer is much lower than most swept-tuned analyzers, because the resolution is determined by the width of the bandpass filters. To get fine resolution over a large frequency range, you would need many many individual filters, making it costly and complex. This is why most parallel-filter analyzers, except the simplest ones in the market are expensive. - VECTOR SIGNAL ANALYSIS (VSA) : In the past, swept-tuned and superheterodyne spectrum analyzers covered wide frequency ranges from audio, thru microwave, to millimeter frequencies. In addition, digital signal processing (DSP) intensive fast Fourier transform (FFT) analyzers provided high-resolution spectrum and network analysis, but were limited to low frequencies due to the limits of analog-to-digital conversion and signal processing technologies. Today's wide-bandwidth, vector-modulated, time-varying signals benefit greatly from the capabilities of FFT analysis and other DSP techniques. Vector signal analyzers combine superheterodyne technology with high speed ADC's and other DSP technologies to offer fast high-resolution spectrum measurements, demodulation, and advanced time-domain analysis. The VSA is especially useful for characterizing complex signals such as burst, transient, or modulated signals used in communications, video, broadcast, sonar and ultrasound imaging applications. According to form factors, spectrum analyzers are grouped as benchtop, portable, handheld and networked. Benchtop models are useful for applications where the spectrum analyzer can be plugged into AC power,such as in a lab environment or manufacturing area. Bench top spectrum analyzers generally offer better performance and specifications than the portable or handheld versions. However they are generally heavier and have several fans for cooling. Some BENCHTOP SPECTRUM ANALYZERS offer optional battery packs, allowing them to be used away from a mains outlet. Those are referred to as a PORTABLE SPECTRUM ANALYZERS. Portable models are useful for applications where the spectrum analyzer needs to be taken outside to make measurements or carried while in use. A good portable spectrum analyzer is expected to offer optional battery-powered operation to allow the user to work in places without power outlets, a clearly viewable display to allow the screen to be read in bright sunlight, darkness or dusty conditions, light weight. HANDHELD SPECTRUM ANALYZERS are useful for applications where the spectrum analyzer needs to be very light and small. Handheld analyzers offer a limited capability as compared to larger systems. Advantages of handheld spectrum analyzers are however their very low power consumption, battery-powered operation while in the field to allow the user to move freely outside, very small size & light weight. Finally, NETWORKED SPECTRUM ANALYZERS do not include a display and they are designed to enable a new class of geographically-distributed spectrum monitoring and analysis applications. The key attribute is the ability to connect the analyzer to a network and monitor such devices across a network. While many spectrum analyzers have an Ethernet port for control, they typically lack efficient data transfer mechanisms and are too bulky and/or expensive to be deployed in such a distributed manner. The distributed nature of such devices enable geo-location of transmitters, spectrum monitoring for dynamic spectrum access and many other such applications. These devices are able to synchronize data captures across a network of analyzers and enable Network-efficient data transfer for a low cost. A PROTOCOL ANALYZER is a tool incorporating hardware and/or software used to capture and analyze signals and data traffic over a communication channel. Protocol analyzers are mostly used for measuring performance and troubleshooting. They connect to the network to calculate key performance indicators to monitor the network and speed-up troubleshooting activities. A NETWORK PROTOCOL ANALYZER is a vital part of a network administrator's toolkit. Network protocol analysis is used to monitor the health of network communications. To find out why a network device is functioning in a certain way, administrators use a protocol analyzer to sniff the traffic and expose the data and protocols that pass along the wire. Network protocol analyzers are used to - Troubleshoot hard-to-solve problems - Detect and identify malicious software / malware. Work with an Intrusion Detection System or a honeypot. - Gather information, such as baseline traffic patterns and network-utilization metrics - Identify unused protocols so that you can remove them from the network - Generate traffic for penetration testing - Eavesdrop on traffic (e.g., locate unauthorized Instant Messaging traffic or wireless Access Points) A TIME-DOMAIN REFLECTOMETER (TDR) is an instrument that uses time-domain reflectometry to characterize and locate faults in metallic cables such as twisted pair wires and coaxial cables, connectors, printed circuit boards,….etc. Time-Domain Reflectometers measure reflections along a conductor. In order to measure them, the TDR transmits an incident signal onto the conductor and looks at its reflections. If the conductor is of a uniform impedance and is properly terminated, then there will be no reflections and the remaining incident signal will be absorbed at the far end by the termination. However, if there is an impedance variation somewhere, then some of the incident signal will be reflected back to the source. The reflections will have the same shape as the incident signal, but their sign and magnitude depend on the change in impedance level. If there is a step increase in the impedance, then the reflection will have the same sign as the incident signal and if there is a step decrease in impedance, the reflection will have the opposite sign. The reflections are measured at the output/input of the Time-Domain Reflectometer and displayed as a function of time. Alternatively, the display can show the transmission and reflections as a function of cable length because the speed of signal propagation is almost constant for a given transmission medium. TDRs can be used to analyze cable impedances and lengths, connector and splice losses and locations. TDR impedance measurements provide designers the opportunity to perform signal integrity analysis of system interconnects and accurately predict the digital system performance. TDR measurements are widely used in board characterization work. A circuit board designer can determine the characteristic impedances of board traces, compute accurate models for board components, and predict board performance more accurately. There are many other areas of application for time-domain reflectometers. A SEMICONDUCTOR CURVE TRACER is a test equipment used to analyze the characteristics of discrete semiconductor devices such as diodes, transistors, and thyristors. The instrument is based on oscilloscope, but contains also voltage and current sources that can be used to stimulate the device under test. A swept voltage is applied to two terminals of the device under test, and the amount of current that the device permits to flow at each voltage is measured. A graph called V-I (voltage versus current) is displayed on the oscilloscope screen. Configuration includes the maximum voltage applied, the polarity of the voltage applied (including the automatic application of both positive and negative polarities), and the resistance inserted in series with the device. For two terminal devices like diodes, this is sufficient to fully characterize the device. The curve tracer can display all of the interesting parameters such as the diode's forward voltage, reverse leakage current, reverse breakdown voltage,…etc. Three-terminal devices such as transistors and FETs also use a connection to the control terminal of the device being tested such as the Base or Gate terminal. For transistors and other current based devices, the base or other control terminal current is stepped. For field effect transistors (FETs), a stepped voltage is used instead of a stepped current. By sweeping the voltage through the configured range of main terminal voltages, for each voltage step of the control signal, a group of V-I curves is generated automatically. This group of curves makes it very easy to determine the gain of a transistor, or the trigger voltage of a thyristor or TRIAC. Modern semiconductor curve tracers offer many attractive features such as intuitive Windows based user interfaces, I-V, C-V and pulse generation, and pulse I-V, application libraries included for every technology…etc. PHASE ROTATION TESTER / INDICATOR: These are compact and rugged test instruments to identify phase sequence on three-phase systems and open/de-energized phases. They are ideal for installing rotating machinery, motors and for checking generator output. Among the applications are the identification of proper phase sequences, detection of missing wire phases, determination of proper connections for rotating machinery, detection of live circuits. A FREQUENCY COUNTER is a test instrument that is used for measuring frequency. Frequency counters generally use a counter which accumulates the number of events occurring within a specific period of time. If the event to be counted is in electronic form, simple interfacing to the instrument is all that is needed. Signals of higher complexity may need some conditioning to make them suitable for counting. Most frequency counters have some form of amplifier, filtering and shaping circuitry at the input. Digital signal processing, sensitivity control and hysteresis are other techniques to improve performance. Other types of periodic events that are not inherently electronic in nature will need to be converted using transducers. RF frequency counters operate on the same principles as lower frequency counters. They have more range before overflow. For very high microwave frequencies, many designs use a high-speed prescaler to bring the signal frequency down to a point where normal digital circuitry can operate. Microwave frequency counters can measure frequencies up to almost 100 GHz. Above these high frequencies the signal to be measured is combined in a mixer with the signal from a local oscillator, producing a signal at the difference frequency, which is low enough for direct measurement. Popular interfaces on frequency counters are RS232, USB, GPIB and Ethernet similar to other modern instruments. In addition to sending measurement results, a counter can notify the user when user-defined measurement limits are exceeded. For details and other similar equipment, please visit our equipment website: http://www.sourceindustrialsupply.com КЛИКНЕТЕ Услуга за пронаоѓање на производи-локатор ПРЕТХОДНА СТРАНИЦА

  • Coating Thickness Gauge, Surface Roughness Tester, Nondestructive Test

    Coating Thickness Gauge - Surface Roughness Tester - Nondestructive Testing - SADT - Mitech - AGS-TECH Inc. - NM - USA Инструменти за тестирање на површинска облога Among our test instruments for coating and surface evaluation are COATING THICKNESS METERS, SURFACE ROUGHNESS TESTERS, GLOSS METERS, COLOR READERS, COLOR DIFFERENCE METER, METALLURGICAL MICROSCOPES, INVERTED METALLOGRAPHIC MICROSCOPE. Our main focus is on NON-DESTRUCTIVE TEST METHODS. We carry high quality brands such as ELCOMETER, SADT-SINOAGE and MITECH. A large percentage of all surfaces around us are coated. Coatings serve many purposes including good appearance, protection and giving products certain desired functionality such as water repelling, enhanced friction, wear and abrasion resistance….etc. Therefore it is of vital importance to be capable to measure, test and evaluate the properties and quality of coatings and surfaces of products. Coatings can be broadly categorized into two main groups if thicknesses are taken into consideration: THICK FILM and THIN FILM COATINGS. Please click on highlighted text below to download respective catalogs. You can procure brand new, or refurbished and used surface coating test instruments from us. Simply indicate the brand name, model number and we will provide you the most competitive quote. AMETEK-LLOYD Instruments Materials Testing (does include also Peeling, Adhesion Test Instruments...etc.) ELCOMETER Inspection Equipment (many coating inspection instruments available) HAIDA Color Assessment Cabinet MI TECH Coating Thickness Gauge Model MCT200 catalog. SADT-SINOAGE Brand Metrology and Test Equipment catalog download. In this catalog you will find some of these instruments for the evaluation of surfaces and coatings. Some of the instruments and techniques used for such purposes are: COATING THICKNESS METER : Different types of coatings require different types of coating testers. A basic understanding of the various techniques is thus essential for the user to choose the right equipment. In the Magnetic Induction Method of coating thickness measurement we measure nonmagnetic coatings over ferrous substrates and magnetic coatings over nonmagnetic substrates. The probe is positioned on the sample and the linear distance between the probe tip that contacts the surface and the base substrate is measured. Inside the measurement probe is a coil that generates a changing magnetic field. When the probe is placed on the sample, the magnetic flux density of this field is altered by the thickness of a magnetic coating or the presence of a magnetic substrate. The change in magnetic inductance is measured by a secondary coil on the probe. The output of the secondary coil is transferred to a microprocessor, where it’s shown as a coating thickness measurement on the digital display. This quick test is suitable for liquid or powder coatings, platings such as chrome, zinc, cadmium or phosphate over steel or iron substrates. Coatings such as paint or powder thicker than 0.1 mm are suitable for this method. The magnetic induction method is not well suited for nickel over steel coatings because of nickel’s partial magnetic property. Phase-sensitive Eddy current method is more suitable for these coatings. Another type of coating where the magnetic induction method is prone to failure is zinc galvanized steel. The probe will read a thickness equal to the total thickness. Newer model instruments are capable of self-calibration by detecting the substrate material through the coating. This is of course very helpful when a bare substrate is not available or when the substrate material is unknown. Cheaper equipment versions require however calibration of the instrument on a bare and uncoated substrate. The Eddy Current Method of coating thickness measurement measures nonconductive coatings on nonferrous conductive substrates, nonferrous conductive coatings on nonconductive substrates and some nonferrous metal coatings on nonferrous metals. It is similar to the magnetic inductive method previously mentioned containing a coil and similar probes. The coil in the Eddy current method has the dual function of excitation and measurement. This probe coil is driven by a high-frequency oscillator to generate an alternating high-frequency field. When placed near a metallic conductor, eddy currents are generated in the conductor. Impedance change takes place in the probe coil. The distance between the probe coil and the conductive substrate material determines the amount of impedance change, which can be measured, correlated to a coating thickness and displayed in the form of a digital reading. Applications include liquid or powder coating on aluminum and nonmagnetic stainless steel, and anodize over aluminum. This method’s reliability depends on the part’s geometry and the coating’s thickness. The substrate needs to be known prior to taking readings. Eddy current probes shouldn’t be used for measuring nonmagnetic coatings over magnetic substrates such as steel and nickel over aluminum substrates. If users must measure coatings over magnetic or nonferrous conductive substrates they will be best served with a dual magnetic induction/Eddy current gage that automatically recognizes the substrate. A third method, called the Coulometric method of coating thickness measurement, is a destructive testing method that has many important functions. Measuring the duplex nickel coatings in the automotive industry is one of it major applications. In the coulometric method, the weight of an area of known size on a metallic coating is determined through localized anodic stripping of the coating. The mass-per-unit area of the coating thickness is then calculated. This measurement on the coating is made using an electrolysis cell, which is filled with an electrolyte specifically selected to strip the particular coating. A constant current runs through the test cell, and since the coating material serves as the anode, it gets deplated. The current density and the surface area are constant, and thus the coating thickness is proportional to the time it takes to strip and take off the coating. This method is very useful for measuring electrically conductive coatings on a conductive substrate. The Coulometric method can also be used for determining the coating thickness of multiple layers on a sample. For example, the thickness of nickel and copper can be measured on a part with a top coating of nickel and an intermediate copper coating on a steel substrate. Another example of a multilayer coating is chrome over nickel over copper on top of a plastic substrate. Coulometric test method is popular in electroplating plants with a small number of random samples. Yet a fourth method is the Beta Backscatter Method for measuring coating thicknesses. A beta-emitting isotope irradiates a test sample with beta particles. A beam of beta particles is directed through an aperture onto the coated component, and a proportion of these particles are backscattered as expected from the coating through the aperture to penetrate the thin window of a Geiger Muller tube. The gas in the Geiger Muller tube ionizes, causing a momentary discharge across the tube electrodes. The discharge which is in the form of a pulse is counted and translated to a coating thickness. Materials with high atomic numbers backscatter the beta particles more. For a sample with copper as a substrate and a gold coating of 40 microns thick, the beta particles are scattered by both the substrate and the coating material. If the gold coating thickness increases, the backscatter rate also increases. The change in the rate of particles scattered is therefore a measure of the coating thickness. Applications that are suitable for the beta backscatter method are those where the atomic number of the coating and substrate differ by 20 percent. These include gold, silver or tin on electronic components, coatings on machine tools, decorative platings on plumbing fixtures, vapor-deposited coatings on electronic components, ceramics and glass, organic coatings such as oil or lubricant over metals. The beta backscatter method is useful for thicker coatings and for substrate & coating combinations where magnetic induction or Eddy current methods won’t work. Changes in alloys affect the beta backscatter method, and different isotopes and multiple calibrations might be required to compensate. An example would be tin/lead over copper, or tin over phosphorous/bronze well known in printed circuit boards and contact pins, and in these cases the changes in alloys would be better measured with the more expensive X-ray fluorescence method. The X-ray fluorescence method for measuring coating thickness is a noncontact method that allows the measurement of very thin multilayer alloy coatings on small and complex parts. Parts are exposed to X-radiation. A collimator focuses the X-rays onto an exactly defined area of the test specimen. This X-radiation causes characteristic X-ray emission (i.e., fluorescence) from both the coating and the substrate materials of the test specimen. This characteristic X-ray emission is detected with an energy dispersive detector. Using the appropriate electronics, it’s possible to register only the X-ray emission from the coating material or substrate. It’s also possible to selectively detect a specific coating when intermediate layers are present. This technique is widely used on printed circuit boards, jewelry and optical components. The X-ray fluorescence is not suitable for organic coatings. The measured coating’s thickness should not exceed 0.5-0.8 mils. However, unlike the beta backscatter method, X-ray fluorescence can measure coatings with similar atomic numbers (for example nickel over copper). As previously mentioned, different alloys affect an instrument’s calibration. Analyzing base material and coating’s thickness are critical for ensuring precision readings. Todays systems and software programs reduce the need for multiple calibrations without sacrificing quality. Finally it is worth mentioning that there are gages that can operate in several of the above mentioned modes. Some have detachable probes for flexibility in use. Many of these modern instruments do offer statistical analysis capabilities for process control and minimal calibration requirements even if used on differently shaped surfaces or different materials. SURFACE ROUGHNESS TESTERS : Surface roughness is quantified by the deviations in the direction of the normal vector of a surface from its ideal form. If these deviations are large, the surface is considered rough; if they are small, the surface is considered smooth. Commercially available instruments called SURFACE PROFILOMETERS are used to measure and record surface roughness. One of the commonly used instruments features a diamond stylus traveling along a straight line over the surface. The recording instruments are able to compensate for any surface waviness and indicate only roughness. Surface roughness can be observed through a.) Interferometry and b.) Optical microscopy, scanning-electron microscopy, laser or atomic-force microscopy (AFM). Microscopy techniques are especially useful for imaging very smooth surfaces for which features cannot be captured by less sensitive instruments. Stereoscopic photographs are useful for 3D views of surfaces and can be used to measure surface roughness. 3D surface measurements can be performed by three methods. Light from an optical-interference microscope shines against a reflective surface and records the interference fringes resulting from the incident and reflected waves. Laser profilometers are used to measure surfaces through either interferometric techniques or by moving an objective lens to maintain a constant focal length over a surface. The motion of the lens is then a measure of the surface. Lastly, the third method, namely the atomic-force microscope, is used for measuring extremely smooth surfaces on the atomic scale. In other words with this equipment even atoms on the surface can be distinguished. This sophisticated and relatively expensive equipment scans areas of less than 100 micron square on specimen surfaces. GLOSS METERS, COLOR READERS, COLOR DIFFERENCE METER : A GLOSSMETERmeasures the specular reflection gloss of a surface. A measure of gloss is obtained by projecting a light beam with fixed intensity and angle onto a surface and measuring the reflected amount at an equal but opposite angle. Glossmeters are used on a variety of materials such as paint, ceramics, paper, metal and plastic product surfaces. Measuring gloss can serve companies in assuring quality of their products. Good manufacturing practices require consistency in processes and this includes consistent surface finish and appearance. Gloss measurements are carried out at a number of different geometries. This depends on the surface material. For example metals have high levels of reflection and therefore the angular dependence is less as compared to non-metals such as coatings and plastics where angular dependence is higher due to diffuse scattering and absorption. Illumination source and observation reception angles configuration allows measurement over a small range of the overall reflection angle. The measurement results of a glossmeter are related to the amount of reflected light from a black glass standard with a defined refractive index. The ratio of the reflected light to the incident light for the test specimen, compared to the ratio for the gloss standard, is recorded as gloss units (GU). Measurement angle refers to the angle between the incident and reflected light. Three measurement angles (20°, 60°, and 85°) are used for the majority of industrial coatings. The angle is selected based on the anticipated gloss range and the following actions are taken depending on the measurement: Gloss Range..........60° Value.......Action High Gloss............>70 GU..........If measurement exceeds 70 GU, change test setup to 20° to optimize measurement accuracy. Medium Gloss........10 - 70 GU Low Gloss.............<10 GU..........If measurement is less than 10 GU, change test setup to 85° to optimize measurement accuracy. Three types of instruments are available commercially: 60° single angle instruments, a double-angle type that combines 20° and 60° and a triple-angle type that combines 20°, 60° and 85°. Two additional angles are used for other materials, the angle of 45° is specified for the measurement of ceramics, films, textiles and anodized aluminum, while the measurement angle 75° is specified for paper and printed materials. A COLOR READER or also referred to as COLORIMETER is a device that measures the absorbance of particular wavelengths of light by a specific solution. Colorimeters are most commonly used to determine the concentration of a known solute in a given solution by the application of the Beer-Lambert law, which states that the concentration of a solute is proportional to the absorbance. Our portable color readers can also be used on plastic, painting, platings, textiles, printing, dye making, food such as butter, french fries, coffee, baked products and tomatoes….etc. They can be used by amateurs who don’t have professional knowledge on colors. Since there are many types of color readers, the applications are endless. In quality control they are used mainly to insure samples fall within color tolerances set by the user. To give you an example, there are handheld tomato colorimeters which use an USDA approved index to measure and grade the color of processed tomato products. Yet another example are handheld coffee colorimeters specifically designed to measure the color of whole green beans, roasted beans, and roasted coffee using industry standard measurements. Our COLOR DIFFERENCE METERS display directly color difference by E*ab, L*a*b, CIE_L*a*b, CIE_L*c*h. Standard deviation is within E*ab0.2 They work on any color and testing takes only seconds of time. METALLURGICAL MICROSCOPES and INVERTED METALLOGRAPHIC MICROSCOPE : Metallurgical microscope is usually an optical microscope, but differs from others in the method of the specimen illumination. Metals are opaque substances and therefore they must be illuminated by frontal lighting. Therefore the source of light is located within the microscope tube. Installed in the tube is a plain glass reflector. Typical magnifications of metallurgical microscopes are in the x50 – x1000 range. Bright field illumination is used for producing images with bright background and dark non-flat structure features such as pores, edges and etched grain boundaries. Dark field illumination is used for producing images with dark background and bright non-flat structure features such as pores, edges, and etched grain boundaries. Polarized light is used for viewing metals with non-cubic crystalline structure such as magnesium, alpha-titanium and zinc, responding to cross-polarized light. Polarized light is produced by a polarizer which is located before the illuminator and analyzer and placed before the eyepiece. A Nomarsky prism is used for differential interference contrast system which makes it possible to observe features not visible in bright field. INVERTED METALLOGRAPHIC MICROSCOPES have their light source and condenser on the top, above the stage pointing down, while the objectives and turret are below the stage pointing up. Inverted microscopes are useful for observing features at the bottom of a large container under more natural conditions than on a glass slide, as is the case with a conventional microscope. Inverted microscopes are used in metallurgical applications where polished samples can be placed on top of the stage and viewed from underneath using reflecting objectives and also in micromanipulation applications where space above the specimen is required for manipulator mechanisms and the microtools they hold. Here is a brief summary of some of our test instruments for the evaluation of surfaces and coatings. You can download details of these from the product catalog links provided above. Surface Roughness Tester SADT RoughScan : This is a portable, battery-powered instrument for checking surface roughness with the measured values displayed on a digital readout. The instrument is easy to use and can be used in the lab, manufacturing environments, in shops, and wherever surface roughness testing is required. SADT GT SERIES Gloss Meters : GT series gloss meters are designed and manufactured according to international standards ISO2813, ASTMD523 and DIN67530. The technical parameters conform to JJG696-2002. The GT45 gloss meter is especially designed for measuring plastic films and ceramics, small areas and curved surfaces. SADT GMS/GM60 SERIES Gloss Meters : These glossmeters are designed and manufactured according to international standards ISO2813, ISO7668, ASTM D523, ASTM D2457. The technical parameters also conform to JJG696-2002. Our GM Series gloss meters are well suited to measure painting, coating, plastic, ceramics, leather products, paper, printed materials, floor coverings…etc. It has an appealing and user friendly design, three - angle gloss data is displayed simultaneously, large memory for measurement data, latest bluetooth function and removable memory card to transmit data conveniently, special gloss software to analyze data output, low battery and memory-full indicator. Through Internal bluetooth module and USB interface, GM gloss meters can transfer data to PC or exported to printer via printing interface. Using optional SD cards memory can be extended as much as needed. Precise Color Reader SADT SC 80 : This color reader is mostly used on plastics, paintings,, platings, textiles & costumes, printed products and in the dye manufacturing industries. It is capable to perform color analysis. The 2.4” color screen and portable design offers comfortable use. Three kinds of light sources for user selection, SCI and SCE mode switch and metamerism analysis satisfy your test needs under different work conditions. Tolerance setting, auto -judge color difference values and color deviation functions make you determine the color easily even if you don’t have any professional knowledge on colors. Using professional color analysis software users can perform the color data analysis and observe color differences on the output diagrams. Optional mini printer enables users to print out the color data on site. Portable Color Difference Meter SADT SC 20 : This portable color difference meter is widely used in quality control of plastic and printing products. It is used to capture color efficiently and accurately. Easy to operate, displays color difference by E*ab, L*a*b, CIE_L*a*b, CIE_L*c*h., standard deviation within E*ab0.2, it can be connected to computer through the USB expansion interface for inspection by software. Metallurgical Microscope SADT SM500 : It is a self-contained portable metallurgical microscope ideally suited for metallographic evaluation of metals in laboratory or in situ. Portable design and unique magnetic stand, the SM500 can be attached directly against the surface of ferrous metals at any angle, flatness, curvature and surface complexity for non-destructive examination. The SADT SM500 can also be used with digital camera or CCD image processing system to download metallurgical images to PC for data transfer, analysis, storage and printout. It is basically a portable metallurgical laboratory, with on-site sample preparation, microscope, camera and no need for AC power supply in the field. Natural colors without the need for changing light by dimming the LED lighting provides the best image observed at any time. This instrument has optional accessories including additional stand for small samples, digital camera adapter with eyepiece, CCD with interface, eyepiece 5x/10x/15x/16x, objective 4x/5x/20x/25x/40x/100x, mini grinder, electrolytic polisher, a set of wheel heads, polishing cloth wheel, replica film, filter (green, blue, yellow), bulb. Portable Metallurgraphic Microscope SADT Model SM-3 : This instrument offers a special magnetic base, fixing the unit firmly on the work pieces, it is suitable for large-scale roll test and direct observation, no cutting and sampling needed, LED lighting, uniform color temperature, no heating, forward / backward and left / right moving mechanism, convenient for adjustment of the inspection point, adapter for connecting digital cameras and observing the recordings directly on PC. Optional accessories are similar to the SADT SM500 model. For details, please download product catalog from the link above. Metallurgical Microscope SADT Model XJP-6A : This metalloscope can be easily used in factories, schools, scientific research institutions for identifying and analyzing the microstructure of all kinds of metals and alloys. It is the ideal tool for testing metal materials, verifying the quality of castings and analyzing metallographic structure of the metalized materials. Inverted Metallographic Microscope SADT Model SM400 : The design makes possible inspecting grains of metallurgical samples. Easy installation at the production line and easy to carry. The SM400 is suitable for colleges and factories. An adapter for attaching digital camera to the trinocular tube is also available. This mode needs MI of the metallographic image printing with fixed sizes. We have a selection of CCD adapters for computer print-out with standard magnification and over 60% observation view. Inverted Metallographic Microscope SADT Model SD300M : Infinite focusing optics provides high resolution images. Long distance viewing objective, 20 mm wide field of view, three -plate mechanical stage accepting almost any sample size, heavy loads and allowing nondestructive microscope examination of large components. The three-plate structure provides the microscope stability and durability. The optics provides high NA and long viewing distance, delivering bright, high-resolution images. The new optical coating of SD300M is dust and damp proof. For details and other similar equipment, please visit our equipment website: http://www.sourceindustrialsupply.com КЛИКНЕТЕ Услуга за пронаоѓање на производи-локатор ПРЕТХОДНА СТРАНИЦА

  • Automation Robotic Systems Manufacturing | agstech

    Motion Control, Positioning, Motorized Stage, Actuator, Gripper, Servo Amplifier, Hardware Software Interface Card, Translation Stages, Rotary Table,Servo Motor Автоматизација и роботски системи Производство и склопување Being an engineering integrator, we can provide you AUTOMATION SYSTEMS including: • Motion control and positioning assemblies, motors, motion controller, servo amplifier, motorized stage, lift stage, goniometers, drives, actuators, grippers, direct drive air bearing spindles, hardware-software interface cards and software, custom built pick and place systems, custom built automated inspection systems assembled from translation/rotary stages and cameras, custom built robots, custom automation systems. We also supply manual positioner, manual tilt, rotary or linear stage for simpler applications. A large selection of linear and rotary tables/slides/stages that utilize brushless linear direct-drive servomotors, as well as ball screw models driven with brush or brushless rotary motors are available. Air bearing systems are also an option in automation. Depending on your automation requirements and application, we choose translation stages with suitable travel distance, speed, accuracy, resolution, repeatability, load capacity, in-position stability, reliability...etc. Again, depending on your automation application we can supply you either a purely linear or linear/rotary combination stage. We can manufacture special fixtures, tools and combine them with your motion control hardware to turn them into a complete turnkey automation solution for you. If you require also assistance with installing drivers, code writing for specially developed software with user friendly interface, we can send our experienced automation engineer to your site on a contract basis. Our engineer can directly communicate with you on a daily basis so that at the end you have a custom tailored automation system free of bugs and meeting your expectations. Goniometers: For high-accuracy angular alignment of optical components. The design utilizes direct-drive noncontact motor technology. When used with the multiplier, it provides a positioning speed of 150 degrees per second. So whether you are thinking of an automation system with a moving camera, taking snapshots of a product and analyzing the images acquired to determine a product defect, or whether you are trying to reduce manufacturing leadtimes by integrating a pick and place robot to your automated manufacturing, call us, contact us and you will be glad with the solutions we can provide you. ROBOTS and COBOTS Here are brochures of some off-shelf robots you can download. If you wish we can build you customized robots and cobots that will better fit your needs and applications. We can either redesign and modify existing robot platforms or make new designs for you. Click on blue colored text below to download catalogs: - Collaborative Robots - Customized Agricultural Robots - Customized Commercial Places Robots - Customized Health Care and Hospital Robots - Customized Warehousing Robots - Customized Robots for a Variety of Applications - Food and Beverage Delivery Robot-A302-A302D - Hospital Delivery Robot A801 - Indoor Delivery Robots A301-A301A - Indoor Delivery Robot A305 - Mobile Robot Platform A001 - Robotic Laser Welding Workstation - Robotics Product Brochure - Robotics Workstations - Robot Palletizing Workstation - Robotic Vending Machine A406 - Security Robot A602 - Selection Guide of Industrial Robot Platforms - Small Objects Transfer Robot A503 - Warehouse Logistics Robots A201-A201A - Welding Robots Brochure OTHER ALTERNATIVE ROBOTS and COBOTS No one design or product meets every customer's needs. Below are downloadable brochures for our other products. - Hikrobot Mobile Robots Catalog - Hikvision Logistic Vision Solutions AUTOMATION COMPONENTS AND SPARE PARTS Click on highlighted text to download brochures and catalogs of products you can use as accessories, spare components in building automation systems, robots and cobots: - Barcode and Fixed Mount Scanners - RFID Products - Mobile Computers - Micro Kiosks OEM Technology (We private label these with your brand name and logo if you wish) - Barcode Scanners (We private label these with your brand name and logo if you wish) - Fixed Industrial Scanners (We private label these with your brand name and logo if you wish) - Hikrobot Machine Vision Products - Hikrobot Smart Machine Vision Products - Hikrobot Machine Vision Standard Products - Kinco automation products, including HMI, stepper system, ED servo, CD servo, PLC, field bus. - Kiosk Systems (We private label these with your brand name and logo if you wish) - Kiosk Systems Accessories Guide (We private label these with your brand name and logo if you wish) - Linear Bearings, Die-Set Flange Mount Bearings, Pillow Blocks, Square Bearings and various Shafts & Slides for motion control - Mobile Computers for Enterprises (We private label these with your brand name and logo if you wish) - Motor Starter with UL and CE Certification NS2100111-1158052 - Printers for Barcode Scanners and Mobile Computers (We private label these with your brand name and logo if you wish) - Process Automation Solutions (We private label these with your brand name and logo if you wish) - RFID Readers - Scanners - Encoders - Printers (We private label these with your brand name and logo if you wish) - Vandal-Proof IP65/IP67/IP68 Keyboards, Keypads, Pointing Devices, ATM Pinpads, Medical & Military Keyboards and other similar Rugged Computer Peripherals Download brochure for our CUSTOM MACHINE AND EQUIPMENT MANUFACTURING Dowload brochure for our DESIGN PARTNERSHIP PROGRAM If you are looking for industrial computers, embedded computers, panel PC for your automation system, we invite you to visit our industrial computers store at http://www.agsindustrialcomputers.com If you would like to obtain more information about our engineering and research & development capabilities besides manufacturing capabilities, then we invite you to visit our engineering site http://www.ags-engineering.com КЛИКНЕТЕ Услуга за пронаоѓање на производи-локатор ПРЕТХОДНА СТРАНИЦА

  • Holography - Holographic Glass Grating - AGS-TECH Inc. - New Mexico

    Holography - Holographic Glass Grating - AGS-TECH Inc. - New Mexico - USA Производство на холографски производи и системи Ние доставуваме залихи на полицата, како и прилагодено дизајнирани и произведени ХОЛОГРАФСКИ ПРОИЗВОДИ, вклучувајќи: • Холограмски дисплеи од 180, 270, 360 степени/ Визуелна проекција базирана на холографија • Самолепливи холограмски дисплеи од 360 степени • 3D филм за прозорци за прикажување реклами • Full HD холограмска изложба и холографски дисплеј 3D пирамида за рекламирање со холографија • 3D холографски дисплеј холокуб за рекламирање со холографија • 3D холографски систем за проекција • Холографски екран со 3D Mesh Screen • Заден проектен филм / Преден проектен филм (со ролна) • Интерактивен екран на допир • Заоблен екран за проекција: Екран за заоблена проекција е приспособен производ направен по нарачка за секој клиент. Ние произведуваме заоблени екрани, екрани за активни и пасивни екрани на 3D симулатори и симулациски дисплеи. • Холографски оптички производи како што се налепници за безбедност и автентичност на производот (прилагодено печатење според барање на клиентот) • Холографски стаклени решетки за украсни или илустративни и едукативни апликации. За да дознаете за нашите можности за инженерство и истражување и развој, ве покануваме да ја посетите нашата инженерска страница http://www.ags-engineering.com КЛИКНЕТЕ Услуга за пронаоѓање на производи-локатор ПРЕТХОДНА СТРАНИЦА

  • Fiber Optic Test Instruments, Optical Fiber Testing, OTDR, Loss Meter

    Fiber Optic Test Instruments - Optical Fiber Testing - OTDR - Loss Meter - Fiber Cleaver - from AGS-TECH Inc. - NM - USA Инструменти за тестирање на оптички влакна AGS-TECH Inc. offers the following FIBER OPTIC TEST and METROLOGY INSTRUMENTS : - OPTICAL FIBER SPLICER & FUSION SPLICER & FIBER CLEAVER - OTDR & OPTICAL TIME DOMAIN REFLECTOMETER - AUDIO FIBER CABLE DETECTOR - AUDIO FIBER CABLE DETECTOR - OPTICAL POWER METER - LASER SOURCE - VISUAL FAULT LOCATOR - PON POWER METER - FIBER IDENTIFIER - OPTICAL LOSS TESTER - OPTICAL TALK SET - OPTICAL VARIABLE ATTENUATOR - INSERTION / RETURN LOSS TESTER - E1 BER TESTER - FTTH TOOLS You can download our product catalogs and brochures below to choose a suitable fiber optic test equipment for your needs or you may tell us what you need and we will match something suitable for you. We do have in stock brand new as well as refurbished or used but still very good fiber optic instruments. All our equipment is under warranty. Please download our related brochures and catalogs by clicking the colored text below: ANRITSU Electronic Measuring Instruments EXFO Optical Testing Solutions for Manufacturing and R&D EXFO Data Center Solution Guide EXFO Remote Fiber Testing and Monitoring EXFO Test Solutions for Submarine Networks EXFO Quick Guide to Testing FTTH EXFO Fiber Deep and Remote PHY Test Solutions EXFO OTDR and iOLM Selection Guide EXFO Spectral Testing of Active Systems EXFO Network Equipment Manufacturers End-to End Solutions EXFO Expert-Level Field Test Solutions EXFO Mobile Backhaul End to End Network Assessment EXFO High-Speed Product Portfolio EXFO 40G Testing Solutions TRIBRER Handheld Optical Fiber Instruments and Tools You can purchase brand new, refurbished or used equipment from us at the most competitive discounted prices. Simply choose the product from the downloadable catalogs and let us know the product name, product code and relevant information and we will send you our best quote. What distinguishes AGS-TECH Inc. from other suppliers is our wide spectrum of ENGINEERING INTEGRATION and CUSTOM MANUFACTURING capabilities. Therefore, please let us know if you need a custom jig, a custom automation system designed specifically for your fiber optic testing needs. We can modify existing equipment or integrate various components to build a turn-key solution to your engineering needs. It will be our pleasure to briefly summarize and provide information about the main concepts in the realm of FIBER OPTIC TESTING. FIBER STRIPPING & CLEAVING & SPLICING : There are two major types of splicing, FUSION SPLICING and MECHANICAL SPLICING. In industry and high volume manufacturing, fusion splicing is the most widely used technique as it provides for the lowest loss and least reflectance, as well as providing the strongest and most reliable fiber joints. Fusion splicing machines can splice a single fiber or a ribbon of multiple fibers at one time. Most single mode splices are fusion type. Mechanical splicing on the other hand is mostly used for temporary restoration and mostly for multimode splicing. Fusion splicing requires higher capital expenses as compared to mechanical splicing because it requires a fusion splicer. Consistent low loss splices can only be achieved using proper techniques and keeping equipment in good condition. Cleanliness is vital. FIBER STRIPPERS should be kept clean and in good condition and be replaced when nicked or worn. FIBER CLEAVERS are also vital for good splices as one has to have good cleaves on both fibers. Fusion splicers need proper maintenance and fusing parameters need to be set for the fibers being spliced. OTDR & OPTICAL TIME DOMAIN REFLECTOMETER : This instrument is used to test the performance of new fiber optic links and detect problems with existing fiber links. OTDR traces are graphical signatures of a fiber's attenuation along its length. The optical time domain reflectometer (OTDR) injects an optical pulse into one end of the fiber and analyzes the returning backscattered and reflected signal. A technician at one end of the fiber span can measure and localize attenuation, event loss, reflectance, and optical return loss. Examining non-uniformities in the OTDR trace we can evaluate the performance of the link components such as cables, connectors and splices as well as the quality of the installation. Such fiber tests assure us that the workmanship and quality of the installation meet the design and warranty specifications. OTDR traces help characterize individual events that can often be invisible when conducting only loss/length testing. Only with a complete fiber certification, installers can fully understand the quality of a fiber installation. OTDRs are also used for testing and maintaining fiber plant performance. OTDR allows us to see more details impacted by the cabling installation. OTDR maps the cabling and can illustrate termination quality, location of faults. An OTDR provides advanced diagnostics to isolate a point of failure that may hinder network performance. OTDRs allow discovery of problems or potential problems along the length of a channel that may affect long term reliability. OTDRs characterize features such as attenuation uniformity and attenuation rate, segment length, location and insertion loss of connectors and splices, and other events such as sharp bends that may have been incurred during installation of cables. An OTDR detects, locates, and measures events on fiber links and requires access to only one end of the fiber. Here is a summary of what a typical OTDR can measure: Attenuation (also known as fiber loss): Expressed in dB or dB/km, attenuation represents the loss or the rate of loss between two points along the fiber span. Event Loss: The difference in the optical power level before and after an event, expressed in dB. Reflectance: The ratio of reflected power to incident power of an event, expressed as a negative dB value. Optical Return Loss (ORL): The ratio of the reflected power to the incident power from a fiber optic link or system, expressed as a positive dB value. OPTICAL POWER METERS : These meters measure average optical power out of an optical fiber. Removable connector adapters are used in optical power meters so that various models of fiber optic connectors can be used. Semiconductor detectors inside power meters have sensitivities that vary with the wavelength of light. Therefore they are calibrated at typical fiber optic wavelengths such as 850, 1300 and 1550 nm. Plastic Optical Fiber or POF meters on the other hand are calibrated at 650 and 850 nm. Power meters are sometimes calibrated to read in dB (Decibel) referenced to one miliwatt of optical power. Some power meters however are calibrated in relative dB scale, which is well suited for loss measurements because the reference value may be set to “0 dB” on the output of the test source. Rare but occasionally lab meters measure in linear units such as miliwatts, nanowatts….etc. Power meters cover a very broad dynamic range 60 dB. However most optical power and loss measurements are made in the range 0 dBm to (-50 dBm). Special power meters with higher power ranges of up to +20 dBm are used for testing fiber amplifiers and analog CATV systems. Such higher power levels are needed to assure the proper functioning of such commercial systems. Some laboratory type meters on the other hand can measure at very low power levels down to (-70 dBm) or even lower, because in research and development engineers frequently have to deal with weak signals. Continuous wave (CW) test sources are used frequently for loss measurements. Power meters measure the time average of the optical power instead of the peak power. Fiber optic power meters should be recalibrated frequently by labs with NIST traceable calibration systems. Regardless of price, all power meters have similar inaccuracies typically in the neighborhood of +/-5%. This uncertainty is caused by the variability in coupling efficiency at the adapters/connectors, reflections at polished connector ferrules, unknown source wavelengths, nonlinearities in electronic signal conditioning circuitry of the meters and detector noise at low signal levels. FIBER OPTIC TEST SOURCE / LASER SOURCE : An operator needs a test source as well as a FO power meter in order to make measurements of optical loss or attenuation in fibers, cables and connectors. The test source must be chosen for compatibility with the type of fiber in use and the wavelength desired for performing the test. Sources are either LED's or lasers similar to those used as transmitters in actual fiber optic systems. LED's are generally used for testing multimode fiber and lasers for singlemode fibers. For some tests such as measuring spectral attenuation of fiber, a variable wavelength source is used, which is usually a tungsten lamp with a monochromator to vary the output wavelength. OPTICAL LOSS TEST SETS : Sometimes also refered to as ATTENUATION METERS, these are instruments made of fiber optic power meters and sources which are used to measure the loss of fibers, connectors and connectorized cables. Some optical loss test sets have individual source outputs and meters like a separate power meter and test source, and have two wavelengths from one source output (MM: 850/1300 or SM:1310/1550) Some of them offer bidirectional testing on a single fiber and some have two bidirectional ports. The combination instrument which contains both a meter and a source may be less convenient than an individual source and power meter. This is the case when the ends of the fiber and cable are usually separated by long distances, which would require two optical loss test sets instead of one source and one meter. Some instruments also have a single port for bidirectional measurements. VISUAL FAULT LOCATOR : These are simple instruments that inject visible wavelength light into the system and one can visually trace the fiber from transmitter to receiver to insure correct orientation and continuity. Some visual fault locators have powerful visible light sources such as a HeNe laser or visible diode laser and therefore high loss points can be made visible. Most applications center around short cables such as used in telecommunication central offices to connect to the fiber optic trunk cables. Since the visual fault locator covers the range where OTDRs are not useful, it is complementary instrument to the OTDR in cable troubleshooting. Systems with powerful light sources will work on buffered fiber and jacketed single fiber cable if the jacket is not opaque to the visible light. The yellow jacket of singlemode fibers and orange jacket of multimode fibers will usually pass the visible light. With most multifiber cables this instrument cannot be used. Many cable breaks, macrobending losses caused by kinks in the fiber, bad splices….. can be detected visually with these instruments. These instruments have a short range, typically 3-5 km, due to high attenuation of visible wavelengths in fibers. FIBER IDENTIFIER : Fiber Optic technicians need to identify a fiber in a splice closure or at a patch panel. If one carefully bends a singlemode fiber enough to cause loss, the light that couples out can also be detected by a large area detector. This technique is used in fiber identifiers to detect a signal in the fiber at transmission wavelengths. A fiber identifier generally functions as a receiver, is able to discriminate between no signal, a high speed signal and a 2 kHz tone. By specifically looking for a 2 kHz signal from a test source that is coupled into the fiber, the instrument can identify a specific fiber in a large multifiber cable. This is essential in fast and speedy splicing and restoration processes. Fiber identifiers can be used with buffered fibers and jacketed single fiber cables. FIBER OPTIC TALKSET : Optical talk sets are useful for fiber installation and testing. They transmit voice over fiber optic cables that are installed and allow the technician splicing or testing the fiber to communicate effectively. Talksets are even more useful when walkie-talkies and telephones are not available in remote locations where splicing is being done and in buildings with thick walls where radio waves will not penetrate through. Talksets are most effectively used by setting up the talksets on one fiber and leaving them in operation while testing or splicing work is done. This way there will always be a communications link between the work crews and will facilitate deciding which fibers to work with next. The continuous communications capability will minimize misunderstandings, mistakes and will speed up the process. Talksets include those for networking multi-party communications, especially helpful in restorations, and system talksets for use as intercoms in installed systems. Combination testers and talksets are also available commercially. To this date, unfortunately different manufacturers' talksets can not communicate with each other. VARIABLE OPTICAL ATTENUATOR : Variable Optical Attenuators allow the technician to manually vary the attenuation of the signal in the fiber as it is transmitted through the device. VOAs can be used to balance the signal strengths in fiber circuits or to balance an optical signal when evaluating the dynamic range of the measurement system. Optical attenuators are commonly used in fiber optic communications to test power level margins by temporarily adding a calibrated amount of signal loss, or installed permanently to properly match transmitter and receiver levels. There are fixed, step-wise variable, and continuously variable VOAs commercially available. Variable optical test attenuators generally use a variable neutral density filter. This offers the advantages of being stable, wavelength insensitive, mode insensitive, and a large dynamic range. A VOA may be either manually or motor controlled. Motor control provides users a distinct productivity advantage, since commonly used test sequences can be run automatically. The most accurate variable attenuators have thousands of calibration points, resulting in excellent overall accuracy. INSERTION / RETURN LOSS TESTER : In fiber optics, Insertion Loss is the loss of signal power resulting from the insertion of a device in a transmission line or optical fiber and is usually expressed in decibels (dB). If the power transmitted to the load before insertion is PT and the power received by the load after insertion is PR, then the insertion loss in dB is given by: IL = 10 log10(PT/PR) Optical Return Loss is the ratio of the light reflected back from a device under test, Pout, to the light launched into that device, Pin, usually expressed as a negative number in dB. RL = 10 log10(Pout/Pin) Loss may be caused by reflections and scattering along the fiber network due to contributors such as dirty connectors, broken optical fibers, poor connector mating. Commercial optical return loss (RL) & insertion loss (IL) testers are high performance loss test stations that are designed specially for optical fibre testing, lab testing and passive components production. Some integrate three different tests modes in one test station, working as a stable laser source, optical power meter and a return loss meter. The RL and IL measurements are displayed on two separate LCD screens, whilst in return loss test model, the unit will automatically and synchronously set the same wavelength for the light source and power meter. These instruments come complete with FC, SC, ST and universal adaptors. E1 BER TESTER : Bit error rate (BER) tests allow technicians to test cables and diagnose signal problems in the field. One can configure individual T1 channel groups to run an independent BER test, set one local serial port to Bit error rate test (BERT) mode while the remaining local serial ports continue to transmit and receive normal traffic. The BER test checks communication between the local and the remote ports. When running a BER test, the system expects to receive the same pattern that it is transmitting. If traffic is not being transmitted or received, technicians create a back-to-back loopback BER test on the link or in the network, and send out a predictable stream to ensure that they receive the same data that was transmitted. To determine whether the remote serial port returns the BERT pattern unchanged, technicians must manually enable network loopback at the remote serial port while they configure a BERT pattern to be used in the test at specified time intervals on the local serial port. Later they can display and analyze the total number of error bits transmitted and the total number of bits received on the link. Error statistics can be retrieved anytime during the BER test. AGS-TECH Inc. offers E1 BER (Bit Error Rate) testers that are compact, multi-functional and handheld instruments, specially designed for R&D, production, installation and maintenance of SDH, PDH, PCM, and DATA protocol conversion. They feature self-check and keyboard testing, extensive error and alarm generation, detection and indication. Our testers provide smart menu navigation and have a large color LCD screen allowing test results to be displayed clearly. Test results can be downloaded and printed using product software included in the package. E1 BER Testers are ideal devices for fast problem resolution, E1 PCM line access, maintenance and acceptance testing. FTTH – FIBER TO THE HOME TOOLS : Among the tools we offer are single and multihole fiber strippers, fiber tubing cutter, wire stripper, Kevlar cutter, fiber cable slitter, single fiber protection sleeve, fiber microscope, fiber connector cleaner, connector heating oven, crimping tool, pen type fiber cutter, ribbon fiber buff stripper, FTTH tool bag, portable fiber optic polishing machine. If you haven't found something that fits your needs and would like to search further for other similar equipment, please visit our equipment website: http://www.sourceindustrialsupply.com КЛИКНЕТЕ Услуга за пронаоѓање на производи-локатор ПРЕТХОДНА СТРАНИЦА

  • Micromanufacturing, Surface & Bulk Micromachining, Microscale, MEMS

    Micromanufacturing - Surface & Bulk Micromachining - Microscale Manufacturing - MEMS - Accelerometers - AGS-TECH Inc. Микропроизводство / Микропроизводство / Микромашина / MEMS MICROMANUFACTURING, MICROSCALE MANUFACTURING, MICROFABRICATION or MICROMACHINING refers to our processes suitable for making tiny devices and products in the micron or microns of dimensions. Sometimes the overall dimensions of a micromanufactured product may be larger, but we still use this term to refer to the principles and processes that are involved. We use the micromanufacturing approach to make the following types of devices: Microelectronic Devices: Typical examples are semiconductor chips that function based on electrical & electronic principles. Micromechanical Devices: These are products that are purely mechanical in nature such as very small gears and hinges. Microelectromechanical Devices: We use micromanufacturing techniques to combine mechanical, electrical and electronic elements at very small length scales. Most of our sensors are in this category. Microelectromechanical Systems (MEMS): These microelectromechanical devices also incorporate an integrated electrical system in one product. Our popular commercial products in this category are MEMS accelerometers, air-bag sensors and digital micromirror devices. Depending on the product to be fabricated, we deploy one of the following major micromanufacturing methods: BULK MICROMACHINING: This is a relatively older method which uses orientation-dependent etches on single-crystal silicon. The bulk micromachining approach is based on etching down into a surface, and stopping on certain crystal faces, doped regions, and etchable films to form the required structure. Typical products we are capable of micromanufacturing using bulk micromachining technique are: - Tiny cantilevers - V-groves in silicon for alignment and fixation of optical fibers. SURFACE MICROMACHINING: Unfortunately bulk micromachining is restricted to single-crystal materials, since polycrystalline materials will not machine at different rates in different directions using wet etchants. Therefore surface micromachining stands out as an alternative to bulk micromachining. A spacer or sacrificial layer such as phosphosilicate glass is deposited using CVD process onto a silicon substrate. Generally speaking, structural thin film layers of polysilicon, metal, metal alloys, dielectrics are deposited onto the spacer layer. Using dry etching techniques, the structural thin film layers are patterned and wet etching is used to remove the sacrificial layer, thereby resulting in free-standing structures such as cantilevers. Also possible is using combinations of bulk and surface micromachining techniques for turning some designs into products. Typical products suitable for micromanufacturing using a combination of the above two techniques: - Submilimetric size microlamps (in the order of 0.1 mm size) - Pressure sensors - Micropumps - Micromotors - Actuators - Micro-fluid-flow devices Sometimes, in order to obtain high vertical structures, micromanufacturing is performed on large flat structures horizontally and then the structures are rotated or folded into an upright position using techniques such as centrifuging or microassembly with probes. Yet very tall structures can be obtained in single crystal silicon using silicon fusion bonding and deep reactive ion etching. Deep Reactive Ion Etching (DRIE) micromanufacturing process is carried out on two separate wafers, then aligned and fusion bonded to produce very tall structures that would otherwise be impossible. LIGA MICROMANUFACTURING PROCESSES: The LIGA process combines X-ray lithography, electrodeposition, molding and generally involves the following steps: 1. A few hundreds of microns thick polymethylmetacrylate (PMMA) resist layer is deposited onto the primary substrate. 2. The PMMA is developed using collimated X-rays. 3. Metal is electrodeposited onto the primary substrate. 4. PMMA is stripped and a freestanding metal structure remains. 5. We use the remaining metal structure as a mould and perform injection molding of plastics. If you analyze the basic five steps above, using the LIGA micromanufacturing / micromachining techniques we can obtain: - Freestanding metal structures - Injection molded plastic structures - Using injection molded structure as a blank we can investment cast metal parts or slip-cast ceramic parts. The LIGA micromanufacturing / micromachining processes are time consuming and expensive. However LIGA micromachining produces these submicron precision molds which can be used to replicate the desired structures with distinct advantages. LIGA micromanufacturing can be used for example to fabricate very strong miniature magnets from rare-earth powders. The rare-earth powders are mixed with an epoxy binder and pressed to the PMMA mold, cured under high pressure, magnetized under strong magnetic fields and finally the PMMA is dissolved leaving behind the tiny strong rare-earth magnets which are one of the wonders of micromanufacturing / micromachining. We are also capable to develop multilevel MEMS micromanufacturing / micromachining techniques through wafer-scale diffusion bonding. Basically we can have overhanging geometries within MEMS devices, using a batch diffusion bonding and release procedure. For example we prepare two PMMA patterned and electroformed layers with the PMMA subsequently released. Next, the wafers are aligned face to face with guide pins and press fit together in a hot press. The sacrificial layer on one of the substrates is etched away which results in one of the layers bonded to the other. Other non-LIGA based micromanufacturing techniques are also available to us for the fabrication of various complex multilayer structures. SOLID FREEFORM MICROFABRICATION PROCESSES: Additive micromanufacturing is used for rapid prototyping. Complex 3D structures can be obtained by this micromachining method and no material removal takes place. Microstereolithography process uses liquid thermosetting polymers, photoinitiator and a highly focused laser source to a diameter as small as 1 micron and layer thicknesses of about 10 microns. This micromanufacturing technique is however limited to production of nonconducting polymer structures. Another micromanufacturing method, namely “instant masking” or also known as “electrochemical fabrication” or EFAB involves the production of an elastomeric mask using photolithography. The mask is then pressed against the substrate in an electrodeposition bath so that the elastomer conforms to substrate and excludes plating solution in contact areas. Areas that are not masked are electrodeposited as the mirror image of the mask. Using a sacrificial filler, complex 3D shapes are microfabricated. This “instant masking” micromanufacturing / micromachining method makes it also possible to produce overhangs, arches…etc. КЛИКНЕТЕ Услуга за пронаоѓање на производи-локатор ПРЕТХОДНА СТРАНИЦА

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